CISCEM aims at bringing together an interdisciplinary group of scientists
from the fields of biology, materials science, chemistry, and physics, to discuss
future directions of in-situ electron microscopy research. Topics will include
nanoscale studies of biological samples, and functional materials under realistic or
near realistic conditions, for example, in gaseous environments, at elevated
temperatures, and in liquid. It will be discussed how dynamical processes can be
studied by including the time domain in electron microscopy, while taking into
account the electron beam effects. CISCEM is also open to other in-situ techniques, such as light microscopy, X-ray, near field or scanning probe microscopy, with the view to stimulate fruitful discussions on multi-scale and correlative approaches.
|Prof. Dr. Dr. h.c. Niels de Jonge
INM – Leibniz Institute for New Materials, Saarbrücken, Germany
|Prof. Dr. Christian Mølhave
Technical University of Denmark, Lyngby, Denmark
|Dr. Damien Alloyeau
CNRS / University Paris Diderot-Paris 7, France
Due to a large number of interesting contributions, the Scientific Committee of CISCEM 2018 decided to extend the conference by one day; it will now be held from October 10 to 12.
ONLINE REGISTRATION is open!